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Three-Dimensional Integrated Circuit Design
Three-Dimensional Integrated Circuit Design
Three-Dimensional Integrated Circuit Design
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Three-Dimensional Integrated Circuit Design

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Three-Dimensional Integrated Circuit Design, Second Eition, expands the original with more than twice as much new content, adding the latest developments in circuit models, temperature considerations, power management, memory issues, and heterogeneous integration. 3-D IC experts Pavlidis, Savidis, and Friedman cover the full product development cycle throughout the book, emphasizing not only physical design, but also algorithms and system-level considerations to increase speed while conserving energy. A handy, comprehensive reference or a practical design guide, this book provides effective solutions to specific challenging problems concerning the design of three-dimensional integrated circuits.

Expanded with new chapters and updates throughout based on the latest research in 3-D integration:

  • Manufacturing techniques for 3-D ICs with TSVs
  • Electrical modeling and closed-form expressions of through silicon vias
  • Substrate noise coupling in heterogeneous 3-D ICs
  • Design of 3-D ICs with inductive links
  • Synchronization in 3-D ICs
  • Variation effects on 3-D ICs
  • Correlation of WID variations for intra-tier buffers and wires
  • Offers practical guidance on designing 3-D heterogeneous systems
  • Provides power delivery of 3-D ICs
  • Demonstrates the use of 3-D ICs within heterogeneous systems that include a variety of materials, devices, processors, GPU-CPU integration, and more
  • Provides experimental case studies in power delivery, synchronization, and thermal characterization
LanguageEnglish
Release dateJul 4, 2017
ISBN9780124104846
Three-Dimensional Integrated Circuit Design
Author

Vasilis F. Pavlidis

Vasilis F. Pavlidis received the B.Sc. and M.Eng. degrees in Electrical and Computer Engineering from the Democritus University of Thrace, Greece, in 2000 and 2002, respectively. He received the M.Sc. and Ph.D. degrees in Electrical and Computer Engineering from the University of Rochester, Rochester, NY, in 2003 and 2008, respectively. He is currently an Assistant Professor in the School of Computer Science at the University of Manchester, Manchester, UK. From 2008 to 2012, he was a post-doctoral fellow with the Integrated Systems Laboratory at the Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland. He was with INTRACOM S.A., Athens, Greece, from 2000 to 2002. He has also been a visiting researcher at Synopsys Inc., Mountain View, CA, with the Primetime group in 2007. His current research interests include interconnect modeling and analysis, 3-D and 2.5-D integration, and other issues related to VLSI design. He has published several conference and journal papers in these areas. He was the leading designer of the Rochester cube and co-creator of the Manchester Thermal Analyzer. Dr. Pavlidis is on the editorial board of the Microelectronics Journal and Integration, the VLSI Journal. He also serves on the Technical Program Committees of several IEEE conferences. He is a member of the VLSI Systems & Applications Technical Committee of the Circuits and Systems Society and a member of the IEEE. He is also involved in public policy issues as a member of the ICT working group of the IEEE European Public Policy Initiative.

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    Book preview

    Three-Dimensional Integrated Circuit Design - Vasilis F. Pavlidis

    Three-Dimensional Integrated Circuit Design

    Second Edition

    Vasilis F. Pavlidis

    Ioannis Savidis

    Eby G. Friedman

    Table of Contents

    Cover image

    Title page

    Copyright

    Dedication

    List of Figures

    About the Authors

    Preface to the Second Edition

    Preface to the First Edition

    Acknowledgments

    Organization of the Book

    Chapter 1. Introduction

    Abstract

    1.1 Interconnect Issues in Integrated Systems

    1.2 Three-Dimensional or Vertical Integration

    1.3 Book Organization

    Chapter 2. Manufacturing of Three-Dimensional Packaged Systems

    Abstract

    2.1 Stacking Methods for Transistors, Circuits, and Dies

    2.2 System-on-Package

    2.3 Technologies for System-in-Package

    2.4 Technologies for 2.5-D Integration

    2.5 Summary

    Chapter 3. Manufacturing Technologies for Three-Dimensional Integrated Circuits

    Abstract

    3.1 Monolithic Three-Dimensional ICs

    3.2 Three-Dimensional ICs with Through Silicon Via or Intertier Via

    3.3 Contactless Three-Dimensional ICs

    3.4 Vertical Interconnects for Three-Dimensional ICs

    3.5 Summary

    Chapter 4. Electrical Properties of Through Silicon Vias

    Abstract

    4.1 Physical Characteristics of a Through Silicon Via

    4.2 Electrical Model of Through Silicon Via

    4.3 Modeling a Three-Dimensional Via as a Cylinder

    4.4 Compact Models

    4.5 Through Silicon Via Impedance Models

    4.6 Electrical Characterization Through Numerical Simulation

    4.7 Case Study—Through Silicon Via Characterization of the MITLL TSV process

    4.8 Summary

    Chapter 5. Substrate Noise Coupling in Heterogeneous Three-Dimensional ICs

    Abstract

    5.1 Heterogeneous Substrate Coupling

    5.2 Frequency Response

    5.3 Techniques to Improve Noise Isolation

    5.4 Summary

    Chapter 6. Three-Dimensional ICs with Inductive Links

    Abstract

    6.1 Wireless On-Chip Communication Interfaces

    6.2 On-Chip Inductors for Intertier Links

    6.3 Transmitter and Receiver Circuits

    6.4 Challenges for Wireless On-Chip Communication

    6.5 Intertier Power Transfer

    6.6 Summary

    Chapter 7. Interconnect Prediction Models

    Abstract

    7.1 Interconnect Prediction Models for Two-Dimensional Circuits

    7.2 Interconnect Prediction Models for Three-Dimensional ICs

    7.3 Projections for Three-Dimensional ICs

    7.4 Summary

    Chapter 8. Cost Considerations for Three-Dimensional Integration

    Abstract

    8.1 Through Silicon Via Processing Options

    8.2 Interposer-Based Systems Integration

    8.3 Comparison of Processing Cost for 2.5-D and Three-Dimensional Integration

    8.4 Summary

    Chapter 9. Physical Design Techniques for Three-Dimensional ICs

    Abstract

    9.1 Floorplanning Techniques

    9.2 Floorplanning Three-Dimensional ICs

    9.3 Placement Techniques

    9.4 Placement in Three-Dimensional ICs

    9.5 Routing Techniques

    9.6 Layout Tools

    9.7 Summary

    Chapter 10. Timing Optimization for Two-Terminal Interconnects

    Abstract

    10.1 Intertier Interconnect Models

    10.2 Two-Terminal Nets With a Single Intertier Via

    10.3 Two Terminal Interconnects With Multiple Intertier Vias

    10.4 Summary

    Chapter 11. Timing Optimization for Multiterminal Interconnects

    Abstract

    11.1 Timing Driven Via Placement for Intertier Interconnect Trees

    11.2 Multiterminal Interconnect Via Placement Heuristics

    11.3 Via Placement Algorithms for Interconnect Trees

    11.4 Discussion of Via Placement Results

    11.5 Summary

    Chapter 12. Thermal Modeling and Analysis

    Abstract

    12.1 Heat Transfer in Three-Dimensional ICs

    12.2 Closed-Form Temperature Models

    12.3 Mesh-Based Thermal Models

    12.4 Thermal Analysis Techniques

    12.5 Summary

    Chapter 13. Thermal Management Strategies for Three-Dimensional ICs

    Abstract

    13.1 Thermal Management Through Power Density Reduction

    13.2 Thermal Management Through Enhanced Thermal Conductivity

    13.3 Hybrid Methodologies for Thermal Management

    13.4 Summary

    Chapter 14. Case Study: Thermal Coupling in 3-D Integrated Circuits

    Abstract

    14.1 Thermal Propagation Test Circuit

    14.2 Setup and Experiments

    14.3 Design Considerations Based on Experimental Results

    14.4 Verification of Experimental Results with Simulations

    14.5 Summary

    Chapter 15. Synchronization in Three-Dimensional ICs

    Abstract

    15.1 Synthesis Techniques for Planar Clock Distribution Networks

    15.2 Global Three-Dimensional Clock Distribution Networks

    15.3 Synthesis of Three-Dimensional Clock Distribution Networks

    15.4 Practical Considerations of Three-Dimensional Clock Tree Synthesis

    15.5 Summary

    Chapter 16. Case Study: Clock Distribution Networks for Three-Dimensional ICs

    Abstract

    16.1 MIT Lincoln Laboratories Three-Dimensional IC Fabrication Technology

    16.2 Three-Dimensional Test Circuit Architecture

    16.3 Clock Distribution Network Structures Within the Test Circuit

    16.4 Models of the Clock Distribution Network Topologies Incorporating Three-Dimensional Via Impedance

    16.5 Experimental Results

    16.6 Summary

    Chapter 17. Variability Issues in Three-Dimensional ICs

    Abstract

    17.1 Process Variations in Data paths Within Three-Dimensional ICs

    17.2 Effects of Process Variations on Clock Paths

    17.3 Effect of Process and Power Supply Variations on Three-Dimensional Clock Distribution Networks

    17.4 Summary

    Chapter 18. Power Delivery for Three-Dimensional ICs

    Abstract

    18.1 The Power Delivery Challenge

    18.2 Models for Three-Dimensional Power Distribution Networks

    18.3 Through Silicon Via Technologies to Mitigate Power Supply Noise

    18.4 Decoupling Capacitance for Three-Dimensional Power Distribution Networks

    18.5 Wire Sizing Methods in Three-Dimensional Power Distribution Networks

    18.6 Summary

    Chapter 19. Case Study: 3-D Power Distribution Topologies and Models

    Abstract

    19.1 3-D Power Distribution Network Test Circuit

    19.2 Experimental Results

    19.3 Characteristics of 3-D Power Distribution Topologies

    19.4 Summary

    Chapter 20. 3-D Circuit Architectures

    Abstract

    20.1 Classification of Wire Limited 3-D Circuits

    20.2 3-D Microprocessors and Memories

    20.3 3-D Networks-on-Chip

    20.4 3-D FPGAs

    20.5 Summary

    Chapter 21. Conclusions

    Appendix A. Enumeration of Gate Pairs in a 3-D IC

    Appendix B. Formal Proof of Optimum Single Via Placement

    Appendix C. Proof of the Two-Terminal Via Placement Heuristic

    Appendix D. Proof of Condition for Via Placement of Multi-terminal Nets

    Appendix E. Correlation of WID Variations for Intratier Buffers

    Appendix F. Extension of the Proposed Model to Include Variations of Wires

    Glossary of Terms

    References

    Index

    Copyright

    Morgan Kaufmann is an imprint of Elsevier

    50 Hampshire Street, 5th Floor, Cambridge, MA 02139, United States

    Copyright © 2017, 2009 Elsevier Inc. All rights reserved.

    No part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopying, recording, or any information storage and retrieval system, without permission in writing from the publisher. Details on how to seek permission, further information about the Publisher’s permissions policies and our arrangements with organizations such as the Copyright Clearance Center and the Copyright Licensing Agency, can be found at our website: www.elsevier.com/permissions.

    This book and the individual contributions contained in it are protected under copyright by the Publisher (other than as may be noted herein).

    Notices

    Knowledge and best practice in this field are constantly changing. As new research and experience broaden our understanding, changes in research methods, professional practices, or medical treatment may become necessary.

    Practitioners and researchers must always rely on their own experience and knowledge in evaluating and using any information, methods, compounds, or experiments described herein. In using such information or methods they should be mindful of their own safety and the safety of others, including parties for whom they have a professional responsibility.

    To the fullest extent of the law, neither the Publisher nor the authors, contributors, or editors, assume any liability for any injury and/or damage to persons or property as a matter of products liability, negligence or otherwise, or from any use or operation of any methods, products, instructions, or ideas contained in the material herein.

    British Library Cataloguing-in-Publication Data

    A catalogue record for this book is available from the British Library

    Library of Congress Cataloging-in-Publication Data

    A catalog record for this book is available from the Library of Congress

    ISBN: 978-0-12-410501-0

    For Information on all Morgan Kaufmann publications visit our website at https://www.elsevier.com/books-and-journals

    Publishing Director: Jonathan Simpson

    Acquisition Editor: Jonathan Simpson

    Editorial Project Manager: Charlotte Kent

    Production Project Manager: Punithavathy Govindaradjane

    Cover Designer: Mark Rogers

    Typeset by MPS Limited, Chennai, India

    Dedication

    To Stella for her disarming criticism.

    Vasilis

    To my wife, Ana Lucia, my son, Ioannis Alexander, and to the rest of my family for their endless love and support.

    Ioannis

    To Laurie, my companion in life.

    Eby

    List of Figures

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