3 min listen
MPEP Q & A 290: Use of metric system of measurements in patent applications
MPEP Q & A 290: Use of metric system of measurements in patent applications
ratings:
Length:
3 minutes
Released:
Dec 5, 2023
Format:
Podcast episode
Description
Question: How should measurements be given within a patent application? Answer: In order to minimize the necessity in the future for converting dimensions given in the English system of measurements to the metric system of measurements when using printed patents as research and prior art search documents, all patent applicants should use the metric (S.I.) units followed by the equivalent English units when describing their inventions in the specifications of patent applications. Chapter Details: The answer to this question can be found in chapter 600 of the MPEP. This chapter covers Parts, Form, and Content of Application. The answer is…
The post MPEP Q & A 290: Use of metric system of measurements in patent applications appeared first on Patent Education Series.
The post MPEP Q & A 290: Use of metric system of measurements in patent applications appeared first on Patent Education Series.
Released:
Dec 5, 2023
Format:
Podcast episode
Titles in the series (100)
MPEP Q & A 6: Applicant Initiated Interview Request Forms: Question: What should an Applicant Initiated Interview Request Form include? Answer: An Applicant Initiated Interview Request Form should identify the participants of the interview, the proposed date of the interview, by Patent Bar MPEP Q & A Podcast