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Analytical Techniques for Thin Films: Treatise on Materials Science and Technology, Vol. 27
Analytical Techniques for Thin Films: Treatise on Materials Science and Technology, Vol. 27
Analytical Techniques for Thin Films: Treatise on Materials Science and Technology, Vol. 27
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Analytical Techniques for Thin Films: Treatise on Materials Science and Technology, Vol. 27

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Treatise on Materials Science and Technology, Volume 27: Analytical Techniques for Thin Films covers a set of analytical techniques developed for thin films and interfaces, all based on scattering and excitation phenomena and theories. The book discusses photon beam and X-ray techniques; electron beam techniques; and ion beam techniques. Materials scientists, materials engineers, chemical engineers, and physicists will find the book invaluable.
LanguageEnglish
Release dateOct 22, 2013
ISBN9781483218311
Analytical Techniques for Thin Films: Treatise on Materials Science and Technology, Vol. 27

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    Analytical Techniques for Thin Films - K. N. Tu

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